Video: Garlock Discusses WavePro PTFE Products 

June 14, 2023

At IMS 2023 in San Diego, WavePro’s Senior Business Development Manager, Karl Geoca, caught up with Microwave Journal®’s Eric Higham. Watch this exclusive interview where Karl shares how WavePro PTFE products are revolutionizing the industry with a wide range of dielectric constants at a low loss.

Click here to view the full interview.

Article: Higher Dielectric Constant Material Enables New RF Capabilities

May 15, 2023

This spring, Garlock released WavePro® 150 (WP150), featuring a dielectric constant of 15.0 and a loss tangent of 0.003 at 6 GHz. The launch extends the range of PTFE dielectrics to higher Dk values than previously available, unlocking applications where stability and higher dielectric constants are advantageous.

Click here to read the article featured in Microwave Journal’s May Issue

Technical Paper: Miniaturization of Circular Ring Slot Patch Antenna

March 29, 2023

This technical paper discusses miniaturized square microstrip antenna design for low-frequency applications. Numerous studies with advanced technology have been undertaken on antenna miniaturization to reduce the overall physical dimensions without significant performance degradation.

Click here to read the full paper.

Press Release: Garlock Enters Wireless Communications Industry with WavePro®

August 08, 2022

Garlock has announced the launch of WavePro®, a new made-to-order, low-loss dielectric material for antennas. The news comes after an overwhelmingly positive response to the official release of WavePro® last month at the International Microwave Symposium in Denver, Colorado.

Click here to read the full press release.

Video: Garlock Introduces New Low-Loss Dielectric for RF

June 22, 2022

Sherwin Damdar, Director of Product Management and Innovation at Garlock, talks with Pat Hindle, Microwave Journal® Media Director, about WavePro, their new made to order, low-loss dielectric that comes in Dk values ranging from 2.5 to 12, enabling smaller antennas and other unique devices.

Click here to view the full interview.